_X-rays fluorescence which generated from a sample are parallelized by a slit
and are entered to the crystal at a fixed angle. The angle of the crystal is
changed continuously, and X-ray diffraction intensity is measured by a detector. _In X-ray fluorescence spectrum, the vertical axis corresponds to the unit of
diffraction angle θ and horizontal axis corresponds to the unit of X-ray intensity. _The spectrum suggests the kind and the rough content of element. _Lower limit of detection is about 0.01 % to 0.1 % and detectable elements are 9F – 92 U.
■The principle of XRF-WDX
Fig.1 Principle
_When an atom is exposed to X-rays, an electron is flipped off from an inner
orbital. Then an outer shell electron falls to a lower orbital. _The X-rays (X-ray fluorescence) corresponding to the energy difference of the
two orbitals are released. _Because it is characteristic in the element, the kind of element identified
by these characteristic X-rays.
Fig.2 Overall outline, Sample holder
_The irradiated area of X-rays are limited by the size of sample holder (10 mmφ,20 mmφ,and 30 mmφ) Maximum sample size : 45 mm in diameter, 40 mm in height
Fig.3 XRF-WDX (ZSX Primus Ⅱ (RIGAKU))
■Applications
◆Analysis of the major element in a substance ◆Quantitative analysis of SiO2 and Al2O3 ceramics (A glass bead is prepared and measured.) ◆Analysis of the element of granular materials (A press cast is prepared and measured.)
and are entered to the crystal at a fixed angle. The angle of the crystal is
changed continuously, and X-ray diffraction intensity is measured by a detector.
_In X-ray fluorescence spectrum, the vertical axis corresponds to the unit of
diffraction angle θ and horizontal axis corresponds to the unit of X-ray intensity.
_The spectrum suggests the kind and the rough content of element.
_Lower limit of detection is about 0.01 % to 0.1 % and detectable elements are
9F – 92 U.
orbital. Then an outer shell electron falls to a lower orbital.
_The X-rays (X-ray fluorescence) corresponding to the energy difference of the
two orbitals are released.
_Because it is characteristic in the element, the kind of element identified
by these characteristic X-rays.
Maximum sample size : 45 mm in diameter, 40 mm in height
◆Quantitative analysis of SiO2 and Al2O3 ceramics (A glass bead is prepared and measured.)
◆Analysis of the element of granular materials (A press cast is prepared and measured.)